Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

Relying solely on end-of-line testing isn't enough when security, traceability, and mission reliability are vital.

Researchers have tested eight stand-alone deep learning methods for PV cell fault detection and have found that their accuracy was as high as 73%. All methods were trained and tested on the ELPV ...

Defect inspection scientists from Huazhong University of Science and Technology, Harbin Institute of Technology and The Chinese University of Hong Kong make a thorough review of new perspectives and ...

Over the past decades, physicists and quantum engineers introduced a wide range of systems that perform desired functions leveraging quantum mechanical effects. These include so-called quantum sensors ...